• DocumentCode
    2266195
  • Title

    Removal of particles from wafer stage using wafer-formed cleaning material (cleaning wafer)

  • Author

    Yamauchi, Hiroyuki ; Imaoka, Keiji ; Takahashi, Hiroki ; Namikawa, M. ; Terada, Yuki

  • Author_Institution
    FASL, Fukushima, Japan
  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    389
  • Lastpage
    391
  • Abstract
    As a method of removing particles from a wafer stage. The use of a wafer-shaped cleaning material (hereafter, Cleaning Wafer) was considered for removal of the particles. One concern in using a Cleaning Wafer was that it might be caught in the wafer transfer system; such a failure can be prevented by adjusting the viscoelasticity parameters of the cleaning layer. The other concern was that the Cleaning Wafer might contaminate the wafer stage. The viscoelasticity cleaning layer is designed to produce less contamination. Consequently, by using a Cleaning Wafer, the amount of labor required for wafer cleaning can be decreased significantly.
  • Keywords
    X-ray fluorescence analysis; atomic absorption spectroscopy; etching; integrated circuit manufacture; photoresists; surface cleaning; surface contamination; viscoelasticity; X-ray fluorescence analysis; adhesives; atomic absorption spectroscopy; cleaning layer; cleaning wafer; photoresists; removing particles; viscoelasticity; wafer cleaning; wafer-formed cleaning material; Atomic measurements; Clamps; Cleaning; Contamination; Etching; Helium; Impurities; Large Hadron Collider; Mass spectroscopy; Pollution measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2003 IEEE International Symposium on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7894-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2003.1243309
  • Filename
    1243309