DocumentCode :
2266195
Title :
Removal of particles from wafer stage using wafer-formed cleaning material (cleaning wafer)
Author :
Yamauchi, Hiroyuki ; Imaoka, Keiji ; Takahashi, Hiroki ; Namikawa, M. ; Terada, Yuki
Author_Institution :
FASL, Fukushima, Japan
fYear :
2003
fDate :
30 Sept.-2 Oct. 2003
Firstpage :
389
Lastpage :
391
Abstract :
As a method of removing particles from a wafer stage. The use of a wafer-shaped cleaning material (hereafter, Cleaning Wafer) was considered for removal of the particles. One concern in using a Cleaning Wafer was that it might be caught in the wafer transfer system; such a failure can be prevented by adjusting the viscoelasticity parameters of the cleaning layer. The other concern was that the Cleaning Wafer might contaminate the wafer stage. The viscoelasticity cleaning layer is designed to produce less contamination. Consequently, by using a Cleaning Wafer, the amount of labor required for wafer cleaning can be decreased significantly.
Keywords :
X-ray fluorescence analysis; atomic absorption spectroscopy; etching; integrated circuit manufacture; photoresists; surface cleaning; surface contamination; viscoelasticity; X-ray fluorescence analysis; adhesives; atomic absorption spectroscopy; cleaning layer; cleaning wafer; photoresists; removing particles; viscoelasticity; wafer cleaning; wafer-formed cleaning material; Atomic measurements; Clamps; Cleaning; Contamination; Etching; Helium; Impurities; Large Hadron Collider; Mass spectroscopy; Pollution measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2003 IEEE International Symposium on
ISSN :
1523-553X
Print_ISBN :
0-7803-7894-6
Type :
conf
DOI :
10.1109/ISSM.2003.1243309
Filename :
1243309
Link To Document :
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