Title :
Probabilistic logic modeling of network reliability for hybrid network architectures
Author :
Wyss, Gregory D. ; Schriner, Heather K. ; Gaylor, Timothy R.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Sandia National Laboratories has found that the reliability and failure modes of current-generation network technologies can be effectively modeled using fault tree-based probabilistic logic modeling (PLM) techniques. We have developed fault tree models that include various hierarchical networking technologies and classes of components interconnected in a wide variety of typical and atypical configurations. We discuss the types of results that can be obtained from PLMs and why these results are of great practical value to network designers and analysts. After providing some mathematical background, we describe the “plug-and-play” fault tree analysis methodology that we have developed for modeling connectivity and the provision of network services in several current-generation network architectures. Finally, we demonstrate the flexibility of the method by modeling the reliability of a hybrid example network that contains several interconnected Ethernet, FDDI, and token ring segments
Keywords :
FDDI; computer network reliability; fault trees; internetworking; local area networks; network topology; probabilistic logic; token networks; Ethernet; FDDI; Sandia National Laboratories; connectivity modeling; failure modes; fault tree models; hierarchical networking technologies; hybrid network architectures; network configurations; network reliability; network services; plug-and-play fault tree analysis; probabilistic logic modeling; token ring networks; Communication industry; Ethernet networks; FDDI; Fault trees; Laboratories; Power system reliability; Probabilistic logic; Risk analysis; Telecommunication network reliability; Token networks;
Conference_Titel :
Local Computer Networks, 1996., Proceedings 21st IEEE Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-8186-7617-5
DOI :
10.1109/LCN.1996.558169