DocumentCode :
2266315
Title :
A shallow trench isolation using novel polysilazane-based SOG for deep-submicron technologies and beyond
Author :
Jung-Ho Lee ; Dong-Jun Lee
fYear :
2003
fDate :
30 Sept.-2 Oct. 2003
Firstpage :
419
Lastpage :
422
Abstract :
A novel Spin-On-Glass (SOG), which is called polysilazane-based SOG (SZ-SOG), is shown to have the advantage of simple process, low moisture absorption and high throughput as well as provide excellent gap-fill ability. This material was successfully integrated in a STI layer of logic device without void formation and liner oxidation for the first time. This material shows no problem in view of material, physical integration and electrical requirements compared with the conventional HDP-CVD oxide process.
Keywords :
glass; isolation technology; logic devices; oxidation; polymers; spin coating; HDP-CVD oxide process; deep submicron technology; electrical requirements; liner oxidation; logic device; moisture absorption; polysilazane based SOG; shallow trench isolation; spin on glass; void formation; Bonding; Chemical processes; Etching; Isolation technology; Logic devices; Manufacturing; Moisture; Oxidation; Scanning electron microscopy; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2003 IEEE International Symposium on
ISSN :
1523-553X
Print_ISBN :
0-7803-7894-6
Type :
conf
DOI :
10.1109/ISSM.2003.1243316
Filename :
1243316
Link To Document :
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