DocumentCode
2266684
Title
A run-time RTL debugging methodology for FPGA-based co-simulation
Author
Cheng, X. ; Ruan, A.W. ; Liao, Y.B. ; Li, P. ; Huang, H.C.
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2010
fDate
28-30 July 2010
Firstpage
891
Lastpage
895
Abstract
Logic simulation provides SoC verification with full controllability and observability, but it suffers from very slow simulation speed for complex design. Using hardware emulation such as FPGA can have higher simulation speed. However, it is very hard to debug due to its poor visibility. FPGA-based cosimulation seems to draw a balance, but Design Under Test (DUT) still resides in FPGA and remains hard for debugging. So a run-time RTL debugging methodology for FPGA-assisted verification system is presented. This method provides internal nodes probing on an event-driven cosimulation platform and achieves full observability for DUT. The debugging tools are embedded in HDL simulator using Verilog VPI callback, so signals of testbench and internal nodes of DUT can be observed in a single waveform and updated as simulation runs, making debugging more efficient. The proposed debugging method connects internal nodes directly to a PCI-extended bus, instead of inserting extra scan-chain logic, so the overhead for area is reduced. Our experiment shows that, compared with a similar method in, the area overhead for debug logic is reduced by 30~50% and compile time is shortened by 40~70%.
Keywords
field programmable gate arrays; hardware description languages; integrated circuit testing; program verification; system-on-chip; FPGA-assisted verification; HDL simulator; PCI-extended bus; SoC verification; Verilog VPI callback; controllability; device under test; event-driven cosimulation; hardware emulation; internal nodes probing; logic simulation; observability; run-time RTL debugging; scan-chain logic; Debugging; Field programmable gate arrays; Hardware design languages; Logic gates; Synchronization;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8224-5
Type
conf
DOI
10.1109/ICCCAS.2010.5581847
Filename
5581847
Link To Document