• DocumentCode
    2266684
  • Title

    A run-time RTL debugging methodology for FPGA-based co-simulation

  • Author

    Cheng, X. ; Ruan, A.W. ; Liao, Y.B. ; Li, P. ; Huang, H.C.

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    28-30 July 2010
  • Firstpage
    891
  • Lastpage
    895
  • Abstract
    Logic simulation provides SoC verification with full controllability and observability, but it suffers from very slow simulation speed for complex design. Using hardware emulation such as FPGA can have higher simulation speed. However, it is very hard to debug due to its poor visibility. FPGA-based cosimulation seems to draw a balance, but Design Under Test (DUT) still resides in FPGA and remains hard for debugging. So a run-time RTL debugging methodology for FPGA-assisted verification system is presented. This method provides internal nodes probing on an event-driven cosimulation platform and achieves full observability for DUT. The debugging tools are embedded in HDL simulator using Verilog VPI callback, so signals of testbench and internal nodes of DUT can be observed in a single waveform and updated as simulation runs, making debugging more efficient. The proposed debugging method connects internal nodes directly to a PCI-extended bus, instead of inserting extra scan-chain logic, so the overhead for area is reduced. Our experiment shows that, compared with a similar method in, the area overhead for debug logic is reduced by 30~50% and compile time is shortened by 40~70%.
  • Keywords
    field programmable gate arrays; hardware description languages; integrated circuit testing; program verification; system-on-chip; FPGA-assisted verification; HDL simulator; PCI-extended bus; SoC verification; Verilog VPI callback; controllability; device under test; event-driven cosimulation; hardware emulation; internal nodes probing; logic simulation; observability; run-time RTL debugging; scan-chain logic; Debugging; Field programmable gate arrays; Hardware design languages; Logic gates; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8224-5
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2010.5581847
  • Filename
    5581847