DocumentCode :
2266844
Title :
Temperature sensitivity analysis of high-performance InGaAs(N) (/spl lambda/ = 1.185 - 1.3 /spl mu/m) quantum well lasers
Author :
Tansu, N. ; Mawst, L.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
2002
fDate :
24-24 May 2002
Abstract :
Summary form only given. We find the use of a tensile-strained InGaP buffer layer to be crucial for the growth of the high-In-content InGaAsN QWs on a thick high-Al-content AlGaAs bottom-cladding layers, as evident from the significant improvement in the luminescence from incorporation of the buffer layer. The InGaAs QW laser, exhibits low threshold and transparency current densities.
Keywords :
III-V semiconductors; current density; gallium arsenide; gallium compounds; indium compounds; laser transitions; photoluminescence; quantum well lasers; sensitivity; thermo-optical effects; transparency; InGaAs QW laser; InGaAsN; high-In-content InGaAsN QWs; low threshold; luminescence; quantum well lasers; temperature sensitivity analysis; tensile-strained InGaP buffer layer; thick high-Al-content AlGaAs bottom-cladding layers; transparency current densities; Buffer layers; Current density; Indium gallium arsenide; Loss measurement; Quantum computing; Quantum well lasers; Sensitivity analysis; Temperature dependence; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1033933
Filename :
1033933
Link To Document :
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