Title :
A study of material identification using SAR
Author :
Sotirelis, Paul ; Parker, Jason T. ; Fu, Michael ; Hu, Xueyu ; Albanese, Richard
Author_Institution :
US Air Force Res. Lab., Wright-Patterson AFB, OH, USA
Abstract :
We investigate the feasibility of using synthetic aperture radar (SAR) data to identify materials at each pixel in a SAR image. A fundamental concept underlying our approach is to extract the dispersion of the reflectivity at each pixel by dividing the data into several frequency sub-bands. We first compute synthetic radar data using parameters that are characteristic of a typical wide-band SAR system operating in a spotlight mode and illuminating several scattering regions that differ in their frequency response. Secondly, we process the data by subdividing the full data set into frequency sub-bands thereby extracting the dispersion at each pixel. Third and finally, we perform the material identification using a rudimentary classification analysis. The approach described herein offers a new method for planning experimental data collections for the purpose of material identification through SAR image formation.
Keywords :
synthetic aperture radar; SAR image formation; frequency response; material identification; reflectivity; rudimentary classification analysis; spotlight mode; synthetic aperture radar data; wide-band SAR system; Frequency response; Materials; Radar imaging; Spatial resolution; Synthetic aperture radar;
Conference_Titel :
Radar Conference (RADAR), 2012 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4673-0656-0
DOI :
10.1109/RADAR.2012.6212121