Title :
Learning varying dimension radial basis functions for deformable image alignment
Author :
Yang, Di ; Li, Hongdong
fDate :
Sept. 27 2009-Oct. 4 2009
Abstract :
This paper presents a method for learning Radial Basis Functions (RBF) model with variable dimensions for aligning/registrating images of deformable surface. Traditional RBF-based approach, which is mainly based on a fixed dimension parametric model, often suffers from severe parameter over-fitting and complicated model selection (i.e. select the number and locations of centers determination) problems which lead to inaccurate estimation and unreliable convergence. Our strategy for solving both the parameter over-fitting and model selection problems is through the use of a probabilistic Bayesian inference model to obtain a posterior estimation of the alignment as well as the model parameters simultaneously. To learn the parameters of the Bayesian model, a reversible jump Markov Chain Monte Carlo (RJMCMC) algorithm is employed, allowing us to handle large deformation image registration. Our approach is demonstrated successfully on real image sequences of different deformation types, with results compared favorable against other existing approaches.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; image registration; inference mechanisms; learning (artificial intelligence); radial basis function networks; RBF model; aligning-registrating images; deformable image alignment; learning varying dimension radial basis functions; model selection problems; parameter over-fitting; probabilistic Bayesian inference model; reversible jump Markov Chain Monte Carlo algorithm; surface deformability; Bayesian methods; Biomedical optical imaging; Computer vision; Conferences; Deformable models; Image motion analysis; Image registration; Optical computing; Optical sensors; Pixel;
Conference_Titel :
Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-4442-7
Electronic_ISBN :
978-1-4244-4441-0
DOI :
10.1109/ICCVW.2009.5457681