Title :
Nanoscale optical microscopy in the vectorial focusing regime
Author :
Serrels, K.A. ; Ramsay, E. ; Warburton, R.J. ; Reid, D.T.
Author_Institution :
Sch. of Eng. & Phys. Sci., Heriot-Watt Univ., Edinburgh
Abstract :
By using extreme numerical-aperture solid-immersion microscopy at 1553 nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching 100 nm which substantially surpass the classical scalar diffraction-limit embodied by Sparrowpsilas resolution criterion.
Keywords :
light diffraction; light polarisation; optical focusing; optical microscopy; Sparrow resolution criterion; nanoscale optical microscopy; numerical-aperture solid immersion microscopy; polarization-sensitive imaging; scalar diffraction limit; vectorial focusing; wavelength 153 nm; High-resolution imaging; Image resolution; Lenses; Nonlinear optics; Optical imaging; Optical microscopy; Optical polarization; Optical refraction; Silicon; Ultrafast optics; (180.4315) Nonlinear Microscopy; (350.5730) Resolution;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
