• DocumentCode
    2267085
  • Title

    Sensitivity analysis of interconnect networks based on S-parameter macromodel

  • Author

    Sun, Yanhua ; Dai, Wayne Wei-Ming

  • Author_Institution
    Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA
  • fYear
    1995
  • fDate
    31 Jan-2 Feb 1995
  • Firstpage
    87
  • Lastpage
    92
  • Abstract
    In this paper a simple and efficient approach for time domain sensitivity analysis is presented. Since moments of the Taylor series of a function are derivatives of the function to frequency, the same technique can be used to compute sensitivities. The basic elements in the linear networks are described by their S-parameters and the first derivatives to parameter variations of the S-parameter; which are expressed as Taylor series. A linear network is reduced to an S-parameter based macromodel together with the driving sources and the nodes of interest. The network transfer functions together with their sensitivities with respect to all the parameter variations can be obtained in one pass during the network reduction process. Since the number of external nodes are much less than the total number of nodes in the network, this method is very efficient The method can be extended to compute the second or higher order sensitivities, which are very difficult, if not impossible, for other known methods. Experimental results show that this method is robust and efficient. This method is very useful for performance optimization, especially when the number of design variables and number of specifications are very large
  • Keywords
    S-parameters; linear network analysis; sensitivity analysis; series (mathematics); time-domain analysis; transfer functions; S-parameter macromodel; Taylor series; design; interconnect networks; linear networks; network reduction; optimization; time domain sensitivity analysis; transfer functions; Computer networks; Design optimization; Integrated circuit interconnections; Poles and zeros; Scattering parameters; Sensitivity analysis; Sun; Taylor series; Transfer functions; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multi-Chip Module Conference, 1995. MCMC-95, Proceedings., 1995 IEEE
  • Conference_Location
    Santa Cruz, CA
  • Print_ISBN
    0-8186-6970-5
  • Type

    conf

  • DOI
    10.1109/MCMC.1995.512009
  • Filename
    512009