• DocumentCode
    2267087
  • Title

    Learning shape metrics based on deformations and transport

  • Author

    Charpiat, Guillaume

  • Author_Institution
    Pulsar Project, INRIA Sophia-Antipolis, Sophia Antipolis, France
  • fYear
    2009
  • fDate
    Sept. 27 2009-Oct. 4 2009
  • Firstpage
    328
  • Lastpage
    335
  • Abstract
    Shape evolutions, as well as shape matchings or image segmentation with shape prior, involve the preliminary choice of a suitable metric in the space of shapes. Instead of choosing a particular one, we propose a framework to learn shape metrics from a set of examples of shapes, designed to be able to handle sparse sets of highly varying shapes, since typical shape datasets, like human silhouettes, are intrinsically high-dimensional and non-dense. We formulate the task of finding the optimal metrics on an empirical manifold of shapes as a classical minimization problem ensuring smoothness, and compute its global optimum fast. First, we design a criterion to compute point-to-point matching between shapes which deals with topological changes. Then, given a training set of shapes, we use these matchings to transport deformations observed on any shape to any other one. Finally, we estimate the metric in the tangent space of any shape, based on transported deformations, weighted by their reliability. Experiments on difficult sets are shown, and applications are proposed.
  • Keywords
    image segmentation; shape recognition; handle sparse sets; image segmentation; learning shape metrics; point-to-point matching; shape datasets; shape evolutions; shape matchings; shape metrics; Application software; Computer vision; Humans; Image classification; Image segmentation; Information resources; Layout; Principal component analysis; Shape; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-4442-7
  • Electronic_ISBN
    978-1-4244-4441-0
  • Type

    conf

  • DOI
    10.1109/ICCVW.2009.5457683
  • Filename
    5457683