• DocumentCode
    2267309
  • Title

    Multilinear Isometric Embedding for visual pattern analysis

  • Author

    Liu, Yan ; Liu, Yang ; Chan, Keith C C

  • Author_Institution
    Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
  • fYear
    2009
  • fDate
    Sept. 27 2009-Oct. 4 2009
  • Firstpage
    212
  • Lastpage
    218
  • Abstract
    This paper proposes a novel tensor based dimensionality reduction algorithm called Multilinear Isometric Embedding (MIE) based on a representative manifold learning algorithm Isomap. Unlike Isomap that unfolds input data to the vector form, MIE directly works on more general tensor representation and utilizes iterative strategy to seek the low-dimensional equivalence, which best preserves the global geometry. By avoiding the problems caused by data vectorization, MIE reduces the data analysis difficulty and computational cost. More importantly, MIE keeps the intrinsic tensor structure of the data in low-dimensional representation. Meanwhile, MIE inherits the merits of Isomap, i.e., the ability of uncovering the global geometry of high-dimensional observations. By providing explicit embedding function, MIE makes the embedding of new data points to the low-dimensional space straightforward. Experiments on various datasets validate the effectiveness of proposed method.
  • Keywords
    data reduction; geometry; image processing; learning (artificial intelligence); tensors; Isomap; data analysis; data vectorization; general tensor representation; global geometry; iterative strategy; low-dimensional equivalence; low-dimensional representation; manifold learning; multilinear isometric embedding; tensor based dimensionality reduction; tensor structure; visual pattern analysis; Computational efficiency; Computer vision; Geometry; Independent component analysis; Iterative algorithms; Laplace equations; Linear discriminant analysis; Pattern analysis; Principal component analysis; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-4442-7
  • Electronic_ISBN
    978-1-4244-4441-0
  • Type

    conf

  • DOI
    10.1109/ICCVW.2009.5457696
  • Filename
    5457696