Title :
The normal incidence Goos-Hänchen shift
Author :
Dumelow, T. ; Lima, F. ; Costa, J. A P da ; Albuquerque, E.L.
Author_Institution :
Dept. de Fis., Univ. do Estado do Rio Grande do Norte (UERN), Mossoro
Abstract :
We predict a lateral shift of the reflected beam when an electromagnetic beam is normally incident on an antiferromagnet in the presence of an external field. This shift is confirmed using simulations for Gaussian beams.
Keywords :
antiferromagnetism; light reflection; magneto-optical effects; spectral line shift; Gaussian beams; Goos-Hanchen shift; antiferromagnet; electromagnetic beam; reflected beam shift; Antiferromagnetic materials; Equations; Frequency; Geometry; Magnetic fields; Magnetic materials; Magnetic resonance; Optical beams; Optical reflection; Reflectivity; (160.3820) Magneto-optical materials; (260.2110) Electromagnetic optics; (260.3090) Infrared, far;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
