DocumentCode
2267498
Title
Robust faces manifold modeling: Most expressive Vs. most Sparse criterion
Author
Tan, Xiaoyang ; Qiao, Lishan ; Gao, Wenjuan ; Liu, Jun
Author_Institution
Dept. of Comput. Sci. & Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
fYear
2009
fDate
Sept. 27 2009-Oct. 4 2009
Firstpage
139
Lastpage
146
Abstract
Robust face image modeling under uncontrolled conditions is crucial for the current face recognition systems in practice. One approach is to seek a compact representation of the given image set which encodes the intrinsic lower dimensional manifold of them. Among others, Local Linear Embedding (LLE) is one of the most popular method for that purpose. However, it suffers from the following problems when used for face modeling: 1) it is not robust under uncontrolled conditions (e.g., the underlying images may contain large appearance distortions such as partial occlusion or extreme illumination variations); 2) a fixed neighborhood size is used for all the local patches without considering the actual distribution of samples in the input space; 3) the modeled local structures may not contain enough discriminative information which is essential to the later recognition stage. In this paper, we introduce the Sparse Locally Linear Embedding (SLLE) to address these issues. By replacing the most-expressive type criterion in modeling local patches in LLE with a most-sparse one, SLLE essentially finds and models more discriminative patches. This gives higher model flexibility in the sense of less sensitiveness to incorrect model and higher robustness to outliers. The feasibility and effectiveness of the proposed method is verified with encouraging results on a publicly available face database.
Keywords
face recognition; image representation; face database; face recognition system; fixed neighborhood size; image representation; local linear embedding; most expressive criterion; most sparse criterion; robust face image modeling; robust face manifold modeling; sparse locally linear embedding; Computer vision; Conferences; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
Conference_Location
Kyoto
Print_ISBN
978-1-4244-4442-7
Electronic_ISBN
978-1-4244-4441-0
Type
conf
DOI
10.1109/ICCVW.2009.5457706
Filename
5457706
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