Structural dynamics in laser-excited solids investigated with femtosecond X-ray diffraction

Author

Sokolowski-Tinten, K. ; Blome ; Dietrich, Christian ; Blums ; Horn-Von-Hoegen ; von der Linde, D. ; Cavalleri, A. ; Squier, Jeff ; Kammler, M.

Author_Institution

Inst. for Laser-& Plasmaphys., Essen Univ., Germany

fYear

2002

fDate

24-24 May 2002

Abstract

Summary form only given. Ultrashort x-ray pulses offer a unique combination of atomic-scale spatial and temporal resolution, which permits direct measurements of structural transients on an ultrafast time scale. Using time-resolved X-ray diffraction with femtosecond, multi-keV X-ray pulses we have studied transient lattice dynamics in optically excited semiconductors and metals. In an optical pump/X-ray probe configuration transient changes in X-ray diffraction from [111]-oriented, single-crystalline thin films of Ge and Bi have been measured.

Keywords

X-ray diffraction; bismuth; germanium; high-speed optical techniques; laser beam effects; transients; Bi; Ge; X-ray diffraction; [111]-oriented; atomic-scale spatial resolution; femtosecond X-ray diffraction; laser-excited solids; metals; optical pump/X-ray probe configuration; semiconductors; single-crystalline thin films; structural dynamics; structural transients; transient lattice dynamics; ultrashort x-ray pulses; Atom optics; Atomic measurements; Optical diffraction; Optical films; Optical pulses; Pulse measurements; Solid lasers; Ultrafast optics; X-ray diffraction; X-ray lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Long Beach, CA, USA

Print_ISBN

1-55752-706-7

Type

conf

DOI

10.1109/CLEO.2002.1034001

Filename

1034001