Title :
Achieving accurate thermal characterization using a CFD code: a case study of PLCC packages
Author :
Burgos, Juan ; Manno, Vincent P. ; Azar, Kaveh
Author_Institution :
Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA
Abstract :
Achieving component-level thermal characterization using computational fluid dynamics (CFD) is assessed using a case study approach. The FLOTHERM code is used to simulate the thermal performance of three plastic-based components (68-lead and 84-lead Plastic Leaded Chip Carriers or PLCCs and a 164-lead Plastic Quad Flat Pack or PQFP) under forced air cooling conditions. Predictions of thermal resistance are compared to experimental measurements. One aspect of the work is to use results from a single situation (84-PLCC and an approach air velocity of 1.5 m/sec) to develop a set of “modeling guidelines”. These modeling guidelines are then be applied to the other components and flow conditions (0.76 to 3.05 m/sec) to test their validity. Guideline parameters include near component flow field nodalization, geometric detail in representing conduction paths and code user options such as turbulent flow models. The average deviation of predicted versus measured values of junction to ambient thermal resistance (θja) was 7.5% using the derived guidelines. An additional component design sensitivity investigated was the effect of the introduction of a heat spreading “heat post” in the high temperature regions of the 164-PQFP
Keywords :
cooling; fluid dynamics; forced convection; integrated circuit packaging; plastic packaging; thermal resistance; 1.5 m/s; CFD code; FLOTHERM code; PLCC packages; approach air velocity; component-level thermal characterization; computational fluid dynamics; conduction paths; flow conditions; forced air cooling conditions; geometric detail; heat post; heat spreading; modeling guidelines; near component flow field nodalization; plastic leaded chip carriers; plastic quad flat pack; thermal resistance; turbulent flow models; Computational fluid dynamics; Computational modeling; Cooling; Electrical resistance measurement; Electronics packaging; Guidelines; Plastics; Semiconductor device measurement; Thermal force; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1995. SEMI-THERM XI., Eleventh Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-2434-X
DOI :
10.1109/STHERM.1995.512052