• DocumentCode
    2267789
  • Title

    Application of phase change materials for passive thermal control of plastic quad flat packages (PQFP): a computational study

  • Author

    Pal, D. ; Joshi, Y.

  • Author_Institution
    CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA
  • fYear
    1995
  • fDate
    7-9 Feb 1995
  • Firstpage
    65
  • Lastpage
    71
  • Abstract
    A transient three-dimensional analysis was performed for passive thermal control of a plastic quad flat package (PQFP) by incorporating phase change material (PCM) under the printed wiring board (PWB). Governing conservation equations for mass, momentum and energy were solved by an implicit finite volume numerical technique. The effects of phase change were modelled by a single domain enthalpy-porosity technique. To study the effects of thermal conductivity of the board, a total of four cases were considered with two different board materials. It was found that passive cooling with PCM can arrest the temperature rise for a substantial time, for the power level considered. A higher board thermal conductivity resulted in a reduction in temperature levels. The melt region for a lower thermal conductivity of the board was found to be localized near the package footprint, while, for a higher board conductivity, the melt region extends along the board
  • Keywords
    cooling; finite element analysis; integrated circuit packaging; plastic packaging; thermal conductivity; transient analysis; PQFP; board materials; conservation equations; finite volume numerical technique; melt region; package footprint; passive cooling; passive thermal control; phase change materials; plastic quad flat packages; printed wiring board; single domain enthalpy-porosity technique; thermal conductivity; transient three-dimensional analysis; Conducting materials; Cooling; Equations; Performance analysis; Phase change materials; Plastic packaging; Temperature; Thermal conductivity; Transient analysis; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1995. SEMI-THERM XI., Eleventh Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-2434-X
  • Type

    conf

  • DOI
    10.1109/STHERM.1995.512053
  • Filename
    512053