DocumentCode :
2268465
Title :
Parallel test generation with low communication overhead
Author :
Venkatraman, Sivaramakrishnan ; Seth, Sharad ; Agrawal, Prathima
Author_Institution :
LSI Logic Corp., Milpitas, CA, USA
fYear :
1995
fDate :
4-7 Jan 1995
Firstpage :
116
Lastpage :
120
Abstract :
In this paper we present a method of parallelizing test generation for combinational logic using boolean satisfiability. We propose a dynamic search-space allocation strategy to split work between the available processors. This strategy is easy to implement with a greedy heuristic and is economical in its demand for inter-processor communication. We derive an analytical model to predict the performance of the parallel versus sequential implementations. The effectiveness of our method and analysis is demonstrated by an implementation on a Sequent (shared memory) multiprocessor. The experimental data shows significant performance improvement in parallel implementation, validates our analytical model, and allows predictions of performance for a range of time-out limits and degrees of parallelism
Keywords :
Boolean functions; combinational circuits; logic testing; parallel algorithms; processor scheduling; shared memory systems; software performance evaluation; Sequent multiprocessor; analytical model; boolean satisfiability; combinational logic; dynamic search-space allocation strategy; greedy heuristic; low communication overhead; parallel test generation; shared memory multiprocessor; Analytical models; Boolean functions; Circuit faults; Circuit testing; Economic forecasting; Large scale integration; Logic testing; Performance analysis; Predictive models; Processor scheduling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1995., Proceedings of the 8th International Conference on
Conference_Location :
New Delhi
ISSN :
1063-9667
Print_ISBN :
0-8186-6905-5
Type :
conf
DOI :
10.1109/ICVD.1995.512088
Filename :
512088
Link To Document :
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