Title :
A matrix algorithm for SAR quick look imaging on digital signal processing
Author :
Debao, Ma ; Wugao, Li ; Le Zhongxin ; Jiefeng, Wang
Author_Institution :
Zhong Zhou Electron. Technol. Res. Inst., Zhengzhou, China
Abstract :
Synthetic aperture radar(SAR) imaging processing is a complex operation that requires large amounts of floating point computations. It is very time-consuming to convert SAR raw data into an image on microcomputers. This paper presents a digital imaging matrix algorithm. This algorithm includes range compression, azimuth compression and range walk correction which are implemented by matrix (vector) operation or matrix (vector) translation. It is available for implementation of SAR real-time imaging, and especially suitable for parallel computation on parallel processor, on vector processor. Especially, it provides a new design method for hardware process. The authors design a SQDSPS (SAR Quick-look Digital Signal Processing System) with the algorithm, which is different from the quick-look algorithm SPECAN. The experimental results indicate that the matrix algorithm is significant for saving the SAR imaging time
Keywords :
geophysical signal processing; geophysical techniques; matrix algebra; radar imaging; remote sensing by radar; synthetic aperture radar; terrain mapping; SAR; SAR Quick-look Digital Signal Processing System; SAR quick look imaging; SQDSPS; algorithm; azimuth compression; digital imaging matrix algorithm; digital signal processing; floating point computation; geophysical measurement technique; land surface; matrix algorithm; matrix operation; matrix translation; quick look imaging; radar imaging; radar remote sensing; range compression; range walk correction; synthetic aperture radar; terrain mapping; Azimuth; Concurrent computing; Design methodology; Digital images; Image coding; Image converters; Matrix converters; Microcomputers; Signal processing algorithms; Vector processors;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.858374