• DocumentCode
    2268751
  • Title

    Process Patterns for Aspect-Oriented Software Development

  • Author

    Khaari, Massood ; Ramsin, Raman

  • Author_Institution
    Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    22-26 March 2010
  • Firstpage
    241
  • Lastpage
    250
  • Abstract
    Focusing on aspects during early stages of the software development lifecycle has received special attention by many researchers, leading to the advent of numerous Aspect-Oriented Software Development (AOSD) methods. This has consequently given a relatively high level of maturity to aspect-oriented processes. Process patterns, on the other hand, have been adopted as suitable mechanisms for defining or tailoring processes to fit specific organizational/project requirements. Process patterns, which essentially are reusable process components extracted from successful processes and practices, can be used to engineer new software development methodologies or to enhance existing ones. We propose a generic Aspect-Oriented Software Process (AOSP), constructed through studying and abstracting prominent aspect-oriented processes. Based on the proposed AOSP, process patterns are provided which incorporate well-established aspect-oriented practices for different development stages. By employing specific process evaluation criteria, the characteristics of these patterns have been analyzed.
  • Keywords
    aspect-oriented programming; software engineering; aspect oriented software development; process patterns; software development lifecycle; Application software; Assembly; Conferences; Job production systems; Pattern analysis; Programming; Systems engineering and theory; Aspect-Oriented Software Development; Process Patterns; Situational Method Engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering of Computer Based Systems (ECBS), 2010 17th IEEE International Conference and Workshops on
  • Conference_Location
    Oxford
  • Print_ISBN
    978-1-4244-6537-8
  • Electronic_ISBN
    978-1-4244-6538-5
  • Type

    conf

  • DOI
    10.1109/ECBS.2010.33
  • Filename
    5457765