DocumentCode
2268805
Title
A highly testable ASIC for telephone signaling
Author
Jayalakshmi, P. ; Vidya, S. ; Krishnakumar, S. ; Ravisankar, K. ; Kumar, Pamela
Author_Institution
Semicond. Complex Ltd., Bangalore, India
fYear
1995
fDate
4-7 Jan 1995
Firstpage
183
Abstract
A highly testable ASIC for telephone signaling was developed by converting an existing card design into an ASIC. This paper details how the conversion of the design helped in introducing on-line system diagnostic functions. Also during this process various strategies had to be adopted to make the functional and fault simulation time efficient
Keywords
application specific integrated circuits; design for testability; digital integrated circuits; integrated circuit design; integrated circuit testing; telecommunication signalling; telephone equipment; telephony; fault simulation; functional simulation; highly testable ASIC; online system diagnostic functions; telephone signaling; Application specific integrated circuits; CMOS process; Discrete event simulation; Hardware; Observability; Random access memory; Signal design; Signal processing; System testing; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1995., Proceedings of the 8th International Conference on
Conference_Location
New Delhi
ISSN
1063-9667
Print_ISBN
0-8186-6905-5
Type
conf
DOI
10.1109/ICVD.1995.512101
Filename
512101
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