Title :
Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array
Author :
Sawhney, Puneet ; Rasheed, Haroon
Author_Institution :
SGS-Thomson Microelectron., New Delhi, India
Abstract :
This paper describes the design and development of module generators for metallized single-port and dual-port static RAMs (SPRAM and DPRAM) for a 0.5 micron embedded-array family. These generators offer an ASIC designer the ability to choose RAMs of user-defined size with some flexibility on the aspect ratio. An automatic generator characterisation (AGC) tool developed to efficiently characterize RAM generators is discussed
Keywords :
SRAM chips; application specific integrated circuits; circuit CAD; integrated circuit design; 0.5 micron; ASIC design; SRAM chips; aspect ratio; automatic generator characterisation tool; dual-port static RAMs; metallized SRAMs; module generators; single-port static RAMs; static RAM generators; triple-metal embedded array; user-defined size; Application specific integrated circuits; Character generation; Circuit simulation; Data mining; Delay; Metallization; Microelectronics; Power generation; Solid modeling; Timing;
Conference_Titel :
VLSI Design, 1995., Proceedings of the 8th International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-8186-6905-5
DOI :
10.1109/ICVD.1995.512104
