Title :
Efficient multisine testing of analog circuits
Author :
Nagi, Naveena ; Chatterjee, Abhijit ; Balivada, Ashok ; Abraham, Jacob A.
Author_Institution :
LogicVision, San Jose, CA, USA
Abstract :
An efficient method has been developed for generating test waveforms for linear analog circuits which minimize the test effort and maximize the test confidence. The method makes use of a fault-based automatic test pattern generator (ATPG) to generate a set of test frequencies. A successive gradient method is used to combine these individual sinusoidal signals in a way that maximizes the fault coverage. The compressed waveform can be stored on-chip and used for built-in test of analog circuits
Keywords :
analogue integrated circuits; automatic testing; biquadratic filters; built-in self test; fault diagnosis; integrated circuit testing; waveform analysis; AC testing; analog IC; analog circuits; biquadratic filter; built-in test; fault coverage maximization; fault-based automatic test pattern generator; linear analog circuits; multisine testing; sinusoidal signals; successive gradient method; test confidence; test waveform generation; Analog circuits; Analog computers; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Frequency response; Jacobian matrices; Logic testing; Test pattern generators;
Conference_Titel :
VLSI Design, 1995., Proceedings of the 8th International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-8186-6905-5
DOI :
10.1109/ICVD.1995.512115
