• DocumentCode
    2269181
  • Title

    Generating Test Plans for Acceptance Tests from UML Activity Diagrams

  • Author

    Heinecke, Andreas ; Bruckmann, Tobias ; Griebe, Tobias ; Gruhn, Volker

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Leipzig, Leipzig, Germany
  • fYear
    2010
  • fDate
    22-26 March 2010
  • Firstpage
    57
  • Lastpage
    66
  • Abstract
    The Unified Modeling Language (UML) is the standard to specify the structure and behaviour of software systems. The created models are a constitutive part of the software specification that serves as guideline for the implementation and the test of software systems. In order to verify the functionality which is defined within the specification documents, the domain experts need to perform an acceptance test. Hence, they have to generate test cases for the acceptance test. Since domain experts usually have a low level of software engineering knowledge, the test case generation process is challenging and error-prone. In this paper we propose an approach to generate high-level acceptance test plans automatically from business processes. These processes are modeled as UML Activity Diagrams (ACD). Our method enables the application of an all-path coverage criterion to business processes for testing software systems.
  • Keywords
    Unified Modeling Language; diagrams; program testing; UML activity diagrams; Unified Modeling Language; acceptance tests; business processes; domain experts; functionality; software engineering knowledge; software specification; software system testing; specification documents; test case generation process; test plans generation; Application software; Automatic testing; Guidelines; Performance evaluation; Software engineering; Software standards; Software systems; Software testing; System testing; Unified modeling language; Activity Diagram; Model Based Testing; Test Case Generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering of Computer Based Systems (ECBS), 2010 17th IEEE International Conference and Workshops on
  • Conference_Location
    Oxford
  • Print_ISBN
    978-1-4244-6537-8
  • Electronic_ISBN
    978-1-4244-6538-5
  • Type

    conf

  • DOI
    10.1109/ECBS.2010.14
  • Filename
    5457786