DocumentCode :
2269197
Title :
Analytic sheath resolution in high density plasma source simulations
Author :
DiPeso, G. ; Vahedi, V.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
127
Lastpage :
128
Abstract :
Summary form only given, as follows. Capacitive coupling involves the physics of external RF voltages coupling to the plasma through an oscillating sheath. For high density plasmas, the sheath dimension is much smaller than the scale lengths of density and field variation in the bulk of the plasma. To avoid costly numerical resolution of the sheath, we use analytic models to determine sheath voltage drops and power deposition due to Ohmic and stochastic heating at the sheaths. We use Metze´s sheath model (1966) because it provides an ODE for the sheath voltage drop which can be directly incorporated into the numerical solution of Poisson equation. The model has been tested in the particle code PDPI by comparing simulations that resolve the sheath with simulations that use the analytic sheath. The analytic model reproduces the sheath drop fairly well. Alternatively, one can use Godyak and Sternberg´s model (1990) for high frequency RF excitations. We use Lieberman´s model (1988) to calculate Ohmic heating due to the substrate RF current and stochastic heating due to electrons bouncing of the oscillating substrate sheath. For a 13.56 MHz, 4 eV, 10 mTorr argon discharge 6 cm long with 8 inch substrate, P/sub stoc/=0.045(V/sub dc//T/sub c/) W and P/sub ohm/=0.078(V/sub dc//T/sub c/)/sup 1/2/ W, where V/sub dc/ is the time-average sheath voltage. These scalings indicate that stochastic and Ohmic heating at the substrate is typically only a few percent of the power coupled inductively.
Keywords :
argon; plasma density; plasma ohmic heating; plasma oscillations; plasma production; plasma sheaths; plasma simulation; 10 mtorr; 13.56 MHz; 4 eV; 6 cm; 8 in; Ar; Ohmic heating; Poisson equation; analytic model; capacitive coupling; density; electron bouncing; external RF voltages; field variation; high density plasma source simulations; high density plasmas; numerical resolution; oscillating sheath; oscillating substrate sheath; power deposition; scale lengths; sheath dimension; sheath voltage drops; stochastic heating; substrate RF current; Analytical models; Heating; Physics; Plasma density; Plasma sheaths; Plasma sources; Poisson equations; Radio frequency; Stochastic processes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.531544
Filename :
531544
Link To Document :
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