DocumentCode :
2269478
Title :
Analytical calculations of a figure of merit for novel MOSFET architecture for the sub 0.25 μm range
Author :
Biesemans, Serge ; Kubicek, Stefan ; De Meyer, Kristin
Author_Institution :
IMEC, Leuven, Belgium
fYear :
1994
fDate :
5-6 Jun 1994
Firstpage :
11
Lastpage :
14
Abstract :
We present a simple analytical model to evaluate the Short Channel Effect (SCE) and to compare quantitatively how different MOSFET architectures can suppress it. The resulting figure of merit will allow us to rank the structures by their SCE suppressing ability. The model itself is based on an explicit solution of the 2D Poisson equation. A discussion on this model and on the limits of the existing solutions to model the SCE is given. Choosing carefully the boundary conditions and including efficiently the junction depth results in model improvements. The model can act as a framework for a full 2D theory
Keywords :
MOSFET; semiconductor device models; stochastic processes; 0.25 micron; 2D Poisson equation; MOSFET architecture; SCE suppressing ability; analytical model; boundary conditions; figure of merit; full 2D theory; short channel effect; Boundary conditions; Laplace equations; MOSFET circuits; Magneto electrical resistivity imaging technique; Numerical simulation; Scalability; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1994. NUPAD V., International Workshop on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-1867-6
Type :
conf
DOI :
10.1109/NUPAD.1994.343502
Filename :
343502
Link To Document :
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