Title :
High accuracy numerical method for index of refraction estimation with surface plasmon bandgap structures
Author :
Alleyne, Colin J. ; Kirk, Andrew G. ; Charette, Paul G.
Author_Institution :
Photonics Syst. Group, McGill Univ., Montreal, QC
Abstract :
Eigenvector analysis on 2D surface plasmon photonic bandgap images is used for refractive index estimation. High precision (rms error of 3.8 times 10-8RIU) and large dynamic range (n = 1.305 to 1.375) are achieved with noisy data.
Keywords :
eigenvalues and eigenfunctions; energy gap; optical materials; photonic band gap; refractive index; surface plasmon resonance; 2D surface plasmon photonic bandgap images; eigenvector analysis; refractive index estimation; surface plasmon bandgap structure; Dynamic range; Focusing; Lenses; Optical refraction; Optical surface waves; Photonic band gap; Plasmons; Reflectivity; Refractive index; Resonance; 050.1950; 130.6010; 240.6680; 260.3910;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
