Title : 
Ultra Low-Loss 50-70 GHz SPDT Switch in 90 nm CMOS
         
        
            Author : 
Uzunkol, Mehmet ; Rebeiz, Gabriel M.
         
        
            Author_Institution : 
Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
         
        
        
        
        
        
            Abstract : 
This paper presents an ultra low-loss 50-70 GHz single-pole double-throw (SPDT) switch built using standard 90 nm CMOS process. The switch is based on lambda/4 transmission lines with shunt inductors at the output matching network. High substrate resistance contacts are used to achieve low insertion loss. The SPDT switch results in a measured insertion loss of 1.5 dB at 55 GHz and < 2 dB at 50-70 GHz. The measured isolation is > 25 dB, and the output port-to-port isolation is > 27 dB at 50-70 GHz. The measured PldB is 13.5 dBm with a corresponding IIP3 of 22.5 dBm at 60 GHz. The return loss is better than -8 dB at 50-70 GHz. The active chip area is 0.5 times 0.55 mm2 and can be reduced in future designs by folding the on lambda/4 transmission lines. To our knowledge, this paper presents the lowest insertion loss 60 GHz SPDT in any CMOS technology to-date.
         
        
            Keywords : 
CMOS integrated circuits; semiconductor switches; transmission lines; CMOS process; CMOS technology; active chip area; complementary metal-oxide-semiconductor; frequency 50 GHz to 70 GHz; insertion loss; loss 1.5 dB; output matching network; port-to-port isolation; shunt inductors; single-pole double-throw switch; size 90 nm; substrate resistance contacts; transmission lines; CMOS process; CMOS technology; Electrical resistance measurement; Impedance matching; Inductors; Insertion loss; Semiconductor device measurement; Shunt (electrical); Switches; Transmission line measurements;
         
        
        
        
            Conference_Titel : 
Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009. Annual IEEE
         
        
            Conference_Location : 
Greensboro, NC
         
        
        
            Print_ISBN : 
978-1-4244-5191-3
         
        
            Electronic_ISBN : 
1550-8781
         
        
        
            DOI : 
10.1109/csics.2009.5315617