DocumentCode :
2270165
Title :
David M. Goodman Award [2002]
fYear :
2003
fDate :
25-25 Sept. 2003
Keywords :
Awards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
Anaheim, CA, USA
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243545
Filename :
1243545
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2270165
