DocumentCode

2270165

Title

David M. Goodman Award [2002]

fYear

2003

fDate

25-25 Sept. 2003

Keywords

Awards;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings

Conference_Location

Anaheim, CA, USA

ISSN

1080-7725

Print_ISBN

0-7803-7837-7

Type

conf

DOI

10.1109/AUTEST.2003.1243545

Filename

1243545