DocumentCode :
2270268
Title :
A Passive W-Band Imager in 65nm Bulk CMOS
Author :
Tomkins, A. ; Garcia, P. ; Voinigescu, S.P.
Author_Institution :
Edward S. Rogers Sr. Dept. of Ece, Univ. of Toronto, Toronto, ON, Canada
fYear :
2009
fDate :
11-14 Oct. 2009
Firstpage :
1
Lastpage :
4
Abstract :
A passive imager operating in the W-band around 90 GHz has been realized in a digital 65 nm CMOS process. The imager, occupying only 0.41 mm2, integrates an SPDT switch with 4.2 dB loss and 25 dB isolation, a 5-stage telescopic cascode LNA with 27 dB gain at 90 GHz, and a W-band square-law detector, all consuming less than 33 mA from 1.2 V. The imager, when measured without the input SPDT, has a peak responsivity of over 200 kV/W, and a minimum NEP of less than 0.1 pW/VHz. With the input switch, it achieves a 90 kV/W responsivity and an NEP of 0.2 pW/VHz. This receiver represents the highest frequency imager to be implemented in standard CMOS with this level of integration.
Keywords :
CMOS digital integrated circuits; CMOS image sensors; field effect MIMIC; low noise amplifiers; nanoelectronics; switches; 5-stage telescopic cascode LNA; SPDT switch; W-band square-law detector; digital CMOS process; frequency 90 GHz; gain 27 dB; loss 4.2 dB; passive W-band imager; receiver; responsivity; size 65 nm; voltage 1.2 V; CMOS process; Calibration; Detectors; Frequency; Insertion loss; Loss measurement; Noise figure; Resistors; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009. Annual IEEE
Conference_Location :
Greensboro, NC
ISSN :
1550-8781
Print_ISBN :
978-1-4244-5191-3
Electronic_ISBN :
1550-8781
Type :
conf
DOI :
10.1109/csics.2009.5315696
Filename :
5315696
Link To Document :
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