DocumentCode
2270404
Title
A framework on software fault localization: Variable Stress Reaction
Author
Nie, Peng ; Geng, Ji ; Qin, Zhiguang
Author_Institution
Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol., Chengdu, China
fYear
2010
fDate
28-30 July 2010
Firstpage
202
Lastpage
206
Abstract
Since automated fault localization can improve the efficiency of both the testing and debugging process, it comes to an indispensable part of high security and reliable software development for the computer networks. A novel software fault localization framework: Variable Stress Reaction (VSR) is proposed in this paper, which works well for data type overflow detection. The experimental results show that our approach has the potential to be effective in localizing the faults for software.
Keywords
computer networks; program debugging; program testing; security of data; software fault tolerance; computer networks; data type overflow detection; debugging process; security; software development reliability; software fault localization; testing process; variable stress reaction; Arrays; Java; Law; Software; Software engineering; Stress; Syntactics;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8224-5
Type
conf
DOI
10.1109/ICCCAS.2010.5582003
Filename
5582003
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