DocumentCode :
2270417
Title :
Building an automated test system using modular signal sources and digitizers
Author :
Lauterbach, Dr Michael J
Author_Institution :
LeCroy Corp., Chestnut Ridge, NY, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
72
Lastpage :
76
Abstract :
Basic methods and practical advice concerning the use of modular arbitrary waveform generators (AWGs) and digitizers is given in this article. Emphasis is on the use of modular instruments conforming to the PXI standard, though some contrast is also made to a related standard, compactPCI. Of note is the capability of new modular AWG´s to create very precise stimulus signals using 14 bit vertical resolution combined with 10 digit sample clock frequency resolution and the ability for high speed digitizers to capture signals up to 500 MHz bandwidth using 50 GS/s equivalent time sampling for repetitive test signals.
Keywords :
analogue-digital conversion; automatic test equipment; function generators; 500 MHz; ATE; AWG; PXI standard; arbitrary waveform generators; automated test system; compactPCI standard; high speed modular digitizers; modular signal sources; repetitive test signals; sample clock frequency resolution; stimulus signals generation; Automatic testing; Bandwidth; Clocks; Costs; Frequency synchronization; Instruments; Signal generators; Signal resolution; System testing; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243557
Filename :
1243557
Link To Document :
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