Title :
Incorporating boundary scan tools in PXI based ATE systems
Author :
Ehrenberg, Heiko ; Wenzel, Thomas ; Trier, Michael
Author_Institution :
GOEPEL Electron. LLC, Austin, TX, USA
Abstract :
Boundary scan tools in a PXI form factor allow a powerful combination with other test methodologies. This paper discusses possibilities of integrating boundary scan tools in a PXI based ATE system as well as outline test and in-system programming applications based on boundary scan at the device, board and system level. An introduction to boundary scan related design-for-testability is provided.
Keywords :
automatic test equipment; boundary scan testing; design for testability; DFT; PCI extension for instrumentation; PXI based ATE systems; board level test; boundary scan testing; boundary scan tools; design-for-testability; device level test; in-system programming applications; system level test; Automatic testing; Built-in self-test; Business process re-engineering; Chip scale packaging; Circuit testing; Electronic equipment testing; Fixtures; Integrated circuit manufacture; Integrated circuit testing; System testing;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243558
