Title :
W-band noise figure measurement designed for on-wafer characterisation
Author :
Drury, R. ; Pollard, R.D. ; Snowden, C.M.
Author_Institution :
Dept. of Electron. & Electr. Eng., Leeds Univ., UK
Abstract :
The first fully automated noise and S-parameter measurement bench is reported for W-band on-wafer characterisation. A calibration procedure is described that allows the receiver reference plane to be accurately moved to the probe tip.
Keywords :
MIMIC; S-parameters; calibration; electric noise measurement; integrated circuit measurement; millimetre wave measurement; probes; MIMICs; S-parameter measurement; W-band; calibration procedure; noise figure measurement; on-wafer characterisation; probe tip; receiver reference plane; Acoustic reflection; Calibration; Measurement techniques; Noise figure; Noise measurement; Probes; Scattering parameters; Switches; Temperature; Tuners;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512168
