DocumentCode
2270630
Title
An application of membrane probes for on-wafer testing of unmatched high power MMICs
Author
Tonks, D. ; Vaillancourt, W. ; Smith, K. ; Strid, E.
Author_Institution
Raytheon Adv. Dev. Ctr., Andover, MA, USA
Volume
3
fYear
1996
fDate
17-21 June 1996
Firstpage
1289
Abstract
A membrane probe capable of determining large signal power handling capabilities of discrete and partially matched large periphery FETs at microwave frequencies has been developed. This paper describes the application and implementation of a membrane probe for a 15.7 mm partially matched 6 W power amplifier MMIC that employs off-chip matching networks for a high volume multichip module application.
Keywords
MMIC power amplifiers; field effect MMIC; impedance matching; integrated circuit testing; probes; 6 W; large signal power handling capabilities; membrane probes; microwave frequencies; multichip module application; off-chip matching networks; on-wafer testing; partially matched large periphery FETs; power amplifier; unmatched high power MMICs; Biomembranes; FETs; High power amplifiers; Impedance matching; MMICs; Probes; Production; Radio frequency; Radiofrequency amplifiers; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.512172
Filename
512172
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