DocumentCode :
2270752
Title :
Universal high speed RF/microwave test system
Author :
Hatch, Robert R. ; Brandeberry, Randall ; Knox, William
Author_Institution :
Raytheon Co., Sudbury, MA, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
161
Lastpage :
171
Abstract :
This paper describes a high speed and high performance RF test system targeted for a moderate to high quantity manufacturing environment, integrating state of the art capabilities in high speed RF testing, microwave synthetic instrument measurement techniques, product interfacing and calibration. The RF Multi-function Test System (RFMTS) was developed to support a wide variety of RF test demands, targeted at radically reducing test times.
Keywords :
calibration; computerised instrumentation; electronic equipment testing; microwave measurement; military equipment; production testing; test equipment; RF Multi-function Test System; RFMTS; calibration; high speed RF testing; microwave synthetic instrument measurement techniques; product interfacing; test times; universal high speed RF/microwave test system; Assembly systems; Calibration; Costs; Instruments; Measurement techniques; Microwave theory and techniques; Radio frequency; Solid state circuits; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243572
Filename :
1243572
Link To Document :
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