Design of a novel soft error mitigation technique for reconfigurable architectures

Commercially off the shelf (COTS) available reconfigurable architectures are becoming popular for applications where high dependability, performance and low costs are mandatory constraints such as space applications. We present a unique SEE (single event effect) mitigation technique based upon temporal data sampling and weighted voting for synchronous circuits and configuration bit storage for reconfigurable architectures. The design technique addresses both conventional static SEUs (single event upsets) and SETs (single event transients) induced errors which result in data loss for reconfigurable architectures in space. The design technique not only eliminates all the single event upsets and single event transients but eliminates all double event upset as well