• DocumentCode
    2271047
  • Title

    Model-driven test generation for system level validation

  • Author

    Mathaikutty, Deepak A. ; Ahuja, Sumit ; Dingankar, Ajit ; Shukla, Sandeep

  • Author_Institution
    Virginia Tech, Blacksburg
  • fYear
    2007
  • fDate
    7-9 Nov. 2007
  • Firstpage
    83
  • Lastpage
    90
  • Abstract
    Functional validation of System Level Models, such as those modeled with SystemC, is an important and complex problem. One of the problems in their functional validation is the test case generation with good coverage and higher potential to find faults in the design. We propose a coverage-directed test generation framework for system level design validation by combining the synchronous language ESTEREL, and its advanced verification capability, with C++ based system level language SystemC. The main contributions of this paper are (i) the integrated framework for model-driven development and validation of system-level designs with a combination of ESTEREL, and SystemC; and (ii) the test generation framework for generating test suites to satisfy traditional coverage metrics such as the statement and branch as well as a complex metric such as modified condition/decision coverage (MCDC) employed in the validation of safety-critical software systems. The framework also generates tests that attain functional coverage using properties specified in a temporal language and assertion-based verification (namely PSL). We demonstrate the methodology with a case study by developing and validating a critical power state machine component that is used for power management in embedded systems.
  • Keywords
    C++ language; automatic test pattern generation; embedded systems; hardware description languages; logic CAD; logic testing; safety-critical software; system-on-chip; C++ based system level; ESTEREL; SystemC; decision coverage; embedded system; hardware description language; model-driven test generation; modified condition; power state machine component; safety-critical software system; synchronous language; system level validation; temporal language; Automatic testing; Energy management; Machine components; Microprocessors; Software systems; Software testing; Synchronous generators; System testing; System-level design; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
  • Conference_Location
    Irvine, CA
  • ISSN
    1552-6674
  • Print_ISBN
    978-1-4244-1480-2
  • Type

    conf

  • DOI
    10.1109/HLDVT.2007.4392792
  • Filename
    4392792