• DocumentCode
    2271120
  • Title

    Advances in reverse engineering are becoming a vastly more powerful tool in electronic repair of commercial and DoD systems

  • Author

    Powell, Rex H. ; Shah, Ravi H.

  • Author_Institution
    Advanced Electronic Services, Inc, Dobson, NC, USA
  • fYear
    2003
  • fDate
    22-25 Sept. 2003
  • Firstpage
    287
  • Lastpage
    289
  • Abstract
    Reverse engineering has recently evolved into a powerful tool in the electronic repair process. Advances in four areas in the reverse engineering process now combine to offer remarkable speed, flexibility and accuracy to the electronic repair engineer. Test systems hardware innovations increase the rate and resolution of automatic wirelist generation by an order of magnitude. Powerful software developments simultaneously improve robustness and user-friendliness of current GUI-based systems. The constant increase in microprocessor bus speeds make PC-based test equipment the emerging winner for performance, economy, and shorter operator learning curve. Novel mathematical algorithms executed within the new software integrate a number of "intelligent" capabilities that greatly enhance the speed of the wirelist.
  • Keywords
    automatic test equipment; automatic test pattern generation; automatic test software; electronic equipment testing; graphical user interfaces; human computer interaction; maintenance engineering; microcomputer applications; reverse engineering; DoD systems; GUI-based systems; PC-based test equipment; automatic wirelist generation; commercial systems; electronic repair process; integrated intelligent capabilities; mathematical algorithms; microprocessor bus speeds; operator learning curve; reverse engineering; robustness; software developments; test systems hardware; user-friendliness; wirelist capture method speed; Automatic testing; Hardware; Microprocessors; Power engineering and energy; Programming; Reverse engineering; Robustness; System testing; Technological innovation; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7837-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2003.1243589
  • Filename
    1243589