DocumentCode :
2271120
Title :
Advances in reverse engineering are becoming a vastly more powerful tool in electronic repair of commercial and DoD systems
Author :
Powell, Rex H. ; Shah, Ravi H.
Author_Institution :
Advanced Electronic Services, Inc, Dobson, NC, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
287
Lastpage :
289
Abstract :
Reverse engineering has recently evolved into a powerful tool in the electronic repair process. Advances in four areas in the reverse engineering process now combine to offer remarkable speed, flexibility and accuracy to the electronic repair engineer. Test systems hardware innovations increase the rate and resolution of automatic wirelist generation by an order of magnitude. Powerful software developments simultaneously improve robustness and user-friendliness of current GUI-based systems. The constant increase in microprocessor bus speeds make PC-based test equipment the emerging winner for performance, economy, and shorter operator learning curve. Novel mathematical algorithms executed within the new software integrate a number of "intelligent" capabilities that greatly enhance the speed of the wirelist.
Keywords :
automatic test equipment; automatic test pattern generation; automatic test software; electronic equipment testing; graphical user interfaces; human computer interaction; maintenance engineering; microcomputer applications; reverse engineering; DoD systems; GUI-based systems; PC-based test equipment; automatic wirelist generation; commercial systems; electronic repair process; integrated intelligent capabilities; mathematical algorithms; microprocessor bus speeds; operator learning curve; reverse engineering; robustness; software developments; test systems hardware; user-friendliness; wirelist capture method speed; Automatic testing; Hardware; Microprocessors; Power engineering and energy; Programming; Reverse engineering; Robustness; System testing; Technological innovation; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243589
Filename :
1243589
Link To Document :
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