Title :
Testing microprocessor-based boards (VXI/PXI Plug and Play technology applications)
Author :
Gutterman, Loofie
Author_Institution :
Geotest-Marvin Test Systems, Inc, Irvine, CA, USA
Abstract :
Testing microprocessor-based boards (μP) could be a challenge even for the experienced test engineer. This paper reviews the related challenges and available test philosophies for the functional testing of these products.
Keywords :
integrated circuit testing; microprocessor chips; peripheral interfaces; printed circuit testing; synchronisation; test equipment; external test equipment; functional testing; microprocessor-based board testing; test challenges; test philosophies; Circuit faults; Circuit testing; Electronic equipment testing; Emulation; Instruments; Microprocessors; Power engineering and energy; Read only memory; System testing; Test equipment;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243591
