Title :
The implementation of calibration on coplanar waveguide for on-wafer measurements at W-band
Author :
Leroux, H. ; Belquin, J.-M. ; Pollard, R.D. ; Snowden, C.M. ; Howes, M.J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Leeds Univ., UK
Abstract :
The use of 50 ohm co-planar waveguide standards fabricated on semi-insulating gallium arsenide is successfully applied to the problem of probe calibration at W-band (75 to 110 GHz). Experimental verification demonstrates the near-constant characteristic impedance and uniform propagation characteristics of the on-wafer components.
Keywords :
calibration; coplanar waveguides; measurement standards; millimetre wave measurement; 50 ohm; 75 to 110 GHz; GaAs; W-band; calibration; characteristic impedance; coplanar waveguide; on-wafer measurement; probe; propagation characteristics; semi-insulating gallium arsenide; standard; Analytical models; Calibration; Conductors; Coplanar waveguides; Electric variables measurement; Frequency; Impedance measurement; Probes; Scattering parameters; Wavelength measurement;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512196
