DocumentCode
2271214
Title
A simplified calibration procedure for cryogenic microwave measurements
Author
van Zyl, J.E. ; Meyer, P. ; van Niekerk, C.
Author_Institution
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
Volume
3
fYear
1996
fDate
17-21 June 1996
Firstpage
1403
Abstract
A single standard co-axial two-port calibration procedure which uses only one short-circuit as a calibration standard, is presented. The technique uses time-domain reflectometry to model the embedding networks as two lossy transmission lines. It has particular significance for cryogenic measurements where cooling cycles can take up to several hours.
Keywords
calibration; cryogenics; low-temperature techniques; microwave reflectometry; short-circuit currents; time-domain reflectometry; two-port networks; co-axial two-port calibration standard; cryogenic microwave measurement; embedding network; lossy transmission line; short-circuit; time-domain reflectometry; Cables; Calibration; Cryogenics; Electromagnetic heating; Microwave measurements; Performance evaluation; Reflection; Scattering parameters; Time domain analysis; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.512198
Filename
512198
Link To Document