Title :
Embedded diagnostic/prognostic reasoning and information continuity for improved avionics maintenance
Author :
Byington, Carl S. ; Kalgren, Patrick W. ; Johns, Robert ; Beers, Richard J.
Author_Institution :
Impact Technol., LLC, State College, PA, USA
Abstract :
The authors are developing enhanced onboard and at-wing diagnostic technologies applicable to both legacy and new avionics. The paper identifies onboard information sources and automated reasoning techniques that build upon existing built-in-test (BIT) results to improve fault isolation accuracy. Modular software and data elements that combine BIT with contextual information, component usage models, and novel reasoning techniques are described. In addition, the authors identify candidate avionics component applications to implement prognostics (prediction of impending problem) using forecasting techniques. A demonstration of diagnostic/prognostic prototype reasoners and information continuity using an open architecture framework within the streamlined maintenance concept is offered.
Keywords :
aerospace computing; aerospace testing; automatic test equipment; automatic test software; avionics; built-in self test; electronic equipment testing; fault location; inference mechanisms; reliability; at-wing diagnostic technologies; automated reasoning techniques; avionics component applications; avionics maintenance; built-in-test; component usage models; contextual information; diagnostic/prognostic prototype reasoners; embedded diagnostic/prognostic reasoning; fault isolation accuracy; forecasting techniques; impending problem prediction; information continuity; legacy avionics; modular data elements; modular software; onboard diagnostic technologies; onboard information sources; open architecture framework; prognostics; reasoning techniques; streamlined maintenance concept; Aerospace electronics; Application software; Automatic testing; Electronic equipment manufacture; Fault diagnosis; Open systems; Statistics; System testing; Test equipment; XML;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243595