Title :
Expert system controlled microwave tubes
Author :
Siambis, J. ; Bacher, H. ; Bemis, T. ; Hargreaves, T. ; Kolte, G. ; Lee, Minhung ; Rogers, R. ; Symons, R. ; Vaughan, Rodney
Author_Institution :
Devices Div., Litton Syst. Inc., San Carlos, CA, USA
Abstract :
Summary form only given. Expert systems are beginning to have wide and significant application in the control of large systems such as accelerators as well as smaller, everyday systems such as cars, home and medical appliances. The design, manufacture, reliable, long-life operation and life-time cost-effective performance and recycling of high value microwave tubes can benefit significantly by the introduction and integration of expert system controls in microwave tubes. Expert systems are based on a computer module equipped with (a) sensors to measure the state of the system (b) a database and computational capability to compare the measured state of the system against a programmed state (c) capable of deciding and initiating corrective action on the state of the system through (d) adaptive controls and activators capable of modifying the operating state. We have begun the investigation and development of an expert system using the klystron tube L-5838 as a testbed. Initially, all sensors and controls are placed outside the vacuum envelope of the tube in order to minimize the insertion cost of the expert system. We report on an expert system for the input cavity of the klystron tube.
Keywords :
adaptive control; beam handling techniques; expert systems; klystrons; microwave tubes; L-5838; activators; adaptive controls; computational capability; computer module; corrective action; cost-effective performance; database; design; expert system controlled microwave tubes; expert system controls; input cavity; insertion cost; klystron tube; long-life operation; manufacture; microwave tubes; operating state; programmed state; recycling; sensors; vacuum envelope; Control systems; Databases; Expert systems; Home appliances; Klystrons; Manufacturing; Medical control systems; Medical expert systems; Recycling; Sensor systems;
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
Print_ISBN :
0-7803-2669-5
DOI :
10.1109/PLASMA.1995.531589