• DocumentCode
    2271323
  • Title

    Automatic generation of functional coverage models from CTL

  • Author

    Verma, Shireesh ; Harris, Ian G. ; Ramineni, Kiran

  • Author_Institution
    Univ.of California, Irvine
  • fYear
    2007
  • fDate
    7-9 Nov. 2007
  • Firstpage
    159
  • Lastpage
    164
  • Abstract
    Functional coverage models which measure the sufficiency of test stimuli are essential to the verification process. A key source of difficulty in their deployment emanates from the manual and imprecise nature of their development process and the lack of a sound measure of their quality. A functional coverage model can be considered complete only if it accurately reflects the behavior of the Design under Verification (DUV) as described in the specification. We present a method to automatically generate coverage models from a formal CTL description of design properties. Experimental results show that the functional coverage models generated using our technique correlate well with the detection of randomly injected errors into a design.
  • Keywords
    formal logic; formal specification; formal verification; trees (mathematics); CTL; automatic generation; computational tree logic; formal specification; formal verification design; functional coverage model; Art; Automatic testing; Computer science; Construction industry; Embedded computing; Feature extraction; Hardware; Industrial relations; Signal design; System testing; CTL; Coverage Model; Error Detection; Functional Verification; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
  • Conference_Location
    Irvine, CA
  • ISSN
    1552-6674
  • Print_ISBN
    978-1-4244-1480-2
  • Type

    conf

  • DOI
    10.1109/HLDVT.2007.4392806
  • Filename
    4392806