DocumentCode
2271323
Title
Automatic generation of functional coverage models from CTL
Author
Verma, Shireesh ; Harris, Ian G. ; Ramineni, Kiran
Author_Institution
Univ.of California, Irvine
fYear
2007
fDate
7-9 Nov. 2007
Firstpage
159
Lastpage
164
Abstract
Functional coverage models which measure the sufficiency of test stimuli are essential to the verification process. A key source of difficulty in their deployment emanates from the manual and imprecise nature of their development process and the lack of a sound measure of their quality. A functional coverage model can be considered complete only if it accurately reflects the behavior of the Design under Verification (DUV) as described in the specification. We present a method to automatically generate coverage models from a formal CTL description of design properties. Experimental results show that the functional coverage models generated using our technique correlate well with the detection of randomly injected errors into a design.
Keywords
formal logic; formal specification; formal verification; trees (mathematics); CTL; automatic generation; computational tree logic; formal specification; formal verification design; functional coverage model; Art; Automatic testing; Computer science; Construction industry; Embedded computing; Feature extraction; Hardware; Industrial relations; Signal design; System testing; CTL; Coverage Model; Error Detection; Functional Verification; Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
Conference_Location
Irvine, CA
ISSN
1552-6674
Print_ISBN
978-1-4244-1480-2
Type
conf
DOI
10.1109/HLDVT.2007.4392806
Filename
4392806
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