Title :
Automating the IEEE std. 1500 compliance verification for embedded cores
Author :
Benso, A. ; Carlo, S. Di ; Prinetto, P. ; Bosio, A.
Author_Institution :
Politecnico di Torino, Torino
Abstract :
The IEEE 1500 standard for embedded core testing proposes a very effective solution for testing modern system-on-chip (SoC). It proposes a flexible hardware test wrapper architecture, together with a core test language (CTL) used to describe the implemented wrapper functionalities. Already several IP providers have announced compliance in both existing and future design blocks. In this paper we address the challenge of guaranteeing the compliance of a wrapper architecture and its CTL description to the IEEE std. 1500. This is a mandatory step to fully trust the wrapper functionalities in applying the test sequences to the core. The proposed solution aims at implementing a verification framework allowing core providers and/or integrators to automatically verify the compliancy of their products (sold or purchased) to the standard.
Keywords :
IEEE standards; conformance testing; embedded systems; formal verification; industrial property; logic CAD; logic testing; system-on-chip; IEEE 1500 standard; IP provider; SoC design; compliance verification; embedded core testing; flexible hardware test wrapper architecture; system-on-chip; Circuit testing; Hardware; Integrated circuit technology; Integrated circuit testing; Intellectual property; Production; Protocols; Robotics and automation; Silicon; System testing;
Conference_Titel :
High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
Conference_Location :
Irvine, CA
Print_ISBN :
978-1-4244-1480-2
DOI :
10.1109/HLDVT.2007.4392810