DocumentCode :
2271552
Title :
Signal conditioning and data collection in synthetic instruments [ATE systems]
Author :
Lowdermilk, R.W. ; Harris, Frederic I.
Author_Institution :
Mission Solutions, BAE SYSTEMS, San Diego, CA, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
426
Lastpage :
431
Abstract :
Synthetic instruments apply the flexibility and computational capabilities of a digital signal-processing platform to synthesize a wide variety of synthetic instruments. The emphasis presented in traditional descriptions of a synthetic instrument is the architecture and the capabilities of the digital signal processing (DSP) platform and the user interfaces to the same. In this paper we highlight and discuss considerations of the signal conditioning and signal collection tasks. The focal point of the signal collection process is the analog-to-digital converter (ADC), the element that defines the precision and the bandwidth of the sampled data representation of the signal processed by the DSP platform. Analog signal conditioning prior to the ADC performs the task of limiting the input signal bandwidth and possible translation of the spectral band center. Digital signal conditioning following the ADC continues to perform the same tasks by further limiting the bandwidth of the digitized input signal as well as performing spectral translation with appropriate sample rate changes. In addition, the post conversion process can correct gain, phase, and time delay imbalances between input signal paths as well as gain and phase distortion encountered in the analog signal path. We identify and address performance constraints of existing ADCs and present a number of signal processing-based options to enhance and extend the operating regimes of the analog signal conditioning and the ADC conversion process.
Keywords :
analogue-digital conversion; automatic test equipment; signal processing equipment; signal sampling; ADC; ATE systems; DSP platform; analog signal conditioning; analog-to-digital converter; data collection; delay imbalances; digital signal-processing; gain distortion; input signal bandwidth limiting; phase distortion; sample rate; signal collection; signal conditioning; signal sampling; spectral band center translation; synthetic instruments; user interface; Analog-digital conversion; Bandwidth; Computer architecture; Delay effects; Digital signal processing; Instruments; Limiting; Signal processing; Signal synthesis; User interfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243608
Filename :
1243608
Link To Document :
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