Title :
RF synthetic instrumentation: ATS technology insertion and implications
Author :
Krizman, Kevin J. ; Duvall, J.A.
Author_Institution :
Lockheed Martin Inf. Syst., Orlando, FL, USA
Abstract :
This paper describes an evaluation of RF synthetic instrumentation (RFSI) technology for potential inclusion into upgrade and optimization efforts for automatic test systems (ATSs). We examine basic software radio technology and its potential to emulate discrete RF measurement instrumentation, and/or RFSI. We discuss performance criteria for RF ATE and constraints imposed on RFSI implementations due to limitations in the digitization process (A-to-D conversion and D-to-A conversion) and digital signal processing (DSP). We discuss trade-offs between discrete and synthetic test system architectures and briefly consider the conceptual outlook for RFSI technology insertion into established ATS product lines.
Keywords :
analogue-digital conversion; automatic test equipment; digital-analogue conversion; software radio; virtual instrumentation; A-to-D conversion; ATS technology insertion; D-to-A conversion; DSP; RF ATE; RF measurement; RF synthetic instrumentation; RF test; RFSI technology; automatic test systems; digital signal processing; digitization process limitations; measurement instrumentation emulation; software radio technology; Computer architecture; Digital signal processing; Instruments; RF signals; Radio frequency; Signal processing; Software measurement; Software radio; Software testing; System testing;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243609