DocumentCode :
2271575
Title :
Adopting IVI: an incremental approach, one year later [ATE applications]
Author :
O´Donnell, Steven J. ; Schwentner, Jcffrey C.
Author_Institution :
Lockheed Martin Inf. Syst., Orlando, FL, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
436
Lastpage :
443
Abstract :
Lockheed Martin Information Systems (LMIS) is encouraged by the promise interchangeable virtual instruments (IVI) brings to automatic test equipment (ATE). We are committed to the principle of isolating the test program set (TPS) software from the variability of a specific instrument, the concept the IVI foundation was established on. We have demonstrated this commitment by incorporating an IVI-like interface into our automated test systems several years ago when IVI was not adequately defined. As a result, we have seen firsthand the benefits it brings to nonrecurring engineering expenses of new systems. IVI instrument driver technology offers the test system developer many benefits over existing implementations. As instruments become obsolete, or as newer, higher performance or lower cost instruments become available, the significant investment expended on the TPS will be protected. This paper discusses LMIS´s adoption of vendor-supplied IVI drivers into the software architecture of our current programs such as LM-STAR for the joint strike fighter (JSF) and our experiences with IVI driver development tools.
Keywords :
aerospace testing; automatic test equipment; military aircraft; virtual instrumentation; ATE; IVI; IVI instrument driver technology; IVI interface; JSF; TPS software isolation; automatic test equipment; driver development tools; interchangeable virtual instruments; joint strike fighter; test program set; Application software; Automatic test equipment; Automatic testing; Costs; Information systems; Instruments; Investments; Protection; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243610
Filename :
1243610
Link To Document :
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