• DocumentCode
    2271672
  • Title

    Use of intelligent mezzanine carriers for legacy instrument replacement in VXI systems

  • Author

    Guilbeaux, Gary W. ; Clark, David L. ; Harrison, Fred ; Duff, Warren

  • Author_Institution
    C&H Technol. Inc., Round Rock, TX, USA
  • fYear
    2003
  • fDate
    22-25 Sept. 2003
  • Firstpage
    460
  • Lastpage
    465
  • Abstract
    Military and commercial automated test equipment (ATE) users are facing significant problems keeping their ATE supportable for the life cycle of the products they are being used to test. Further, the cost of completely replacing the system is often insignificant compared to the cost of replicating and re-certifying the test program software. As a result, requirements have increasingly surfaced to replace legacy equipment in such a manner as to re-use existing test program software. An approach using open standard mezzanine cards with platform specific carrier boards can provide an enormous selection of modern instruments from many different manufacturers, extensive reuse of legacy equipment and software, and a clear, easy migration path to existing and future platforms. Most common ATE instruments exist in a mezzanine format and carriers can be found for VXI, PXI, PCI, and many other platforms. Carriers can be non-intelligent allowing direct access to the mezzanine modules by the host software, or intelligent allowing on-board firmware to further emulate the legacy instrument.
  • Keywords
    automatic test equipment; firmware; peripheral interfaces; ATE instruments; PCI; PXI; VXI systems; automated test equipment; firmware; intelligent mezzanine carriers; legacy instrument emulation; legacy instrument replacement; open standard mezzanine cards; platform specific carrier boards; test program software reuse; Automatic testing; Costs; Instruments; Life testing; Manufacturing; Military equipment; Software standards; Software testing; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7837-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2003.1243615
  • Filename
    1243615