DocumentCode
2271867
Title
In-circuit electro-optic field mapping for function test and characterization of MMICs
Author
David, G. ; Tempel, R. ; Wolff, I. ; Jager, D.
Author_Institution
FG Optoelektronik, Duisburg, Germany
Volume
3
fYear
1996
fDate
17-21 June 1996
Firstpage
1533
Abstract
In this paper, the results of 2D electro-optic mapping of electric field distributions in two coplanar MMICs are presented. It is demonstrated that the obtained images of the field distributions can be used for function test, failure localization and for a quantitative high frequency characterization of the circuits.
Keywords
MMIC; electric field measurement; electro-optical effects; integrated circuit testing; microwave measurement; 2D electro-optic mapping; coplanar MMIC; electric field distribution; failure localization; high frequency characterization; in-circuit function test; Circuit testing; Inductors; MIM capacitors; MMICs; Microwave Theory and Techniques Society; Microwave transistors; RF signals; Radio frequency; Signal detection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.512228
Filename
512228
Link To Document