Title :
In-circuit electro-optic field mapping for function test and characterization of MMICs
Author :
David, G. ; Tempel, R. ; Wolff, I. ; Jager, D.
Author_Institution :
FG Optoelektronik, Duisburg, Germany
Abstract :
In this paper, the results of 2D electro-optic mapping of electric field distributions in two coplanar MMICs are presented. It is demonstrated that the obtained images of the field distributions can be used for function test, failure localization and for a quantitative high frequency characterization of the circuits.
Keywords :
MMIC; electric field measurement; electro-optical effects; integrated circuit testing; microwave measurement; 2D electro-optic mapping; coplanar MMIC; electric field distribution; failure localization; high frequency characterization; in-circuit function test; Circuit testing; Inductors; MIM capacitors; MMICs; Microwave Theory and Techniques Society; Microwave transistors; RF signals; Radio frequency; Signal detection; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512228
